Nanostructures and their characterization by transmission electron microscopy; science and art
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Abstract
The description of nanometric systems is still being a challenging topic, for this reason, the Transmission Electron Microscopy (TEM) scope is described in a didactic way on several nanosystems (Au nanoparticles and thin Si films), for illustrating the use of the most remarkable TEM techniques. Throughout this work, conventional TEM techniques such as Bright Field (BF), Dark Field (DF), High Angle Annular Dark Feld (HAADF), Selected Area Electron Diffraction (SAED) and Electron Energy Loss Spectroscopy (EELS) are described, emphasizing the differences with less conventional techniques such as Convergent Beam Electron Diffraction (CBED), Large Angle Convergent Beam Electron Diffraction (LACBED) and Precession Electron Diffraction (PED). Also some practical suggestions are given for describing in a simple way the typical contrast found using different TEM techniques, offering a striking, clear and didactic vision of the current scopes of TEM in Mexico.
Article Details
Mundo Nano. Revista Interdisciplinaria en Nanociencias y Nanotecnología por Universidad Nacional Autónoma de México se distribuye bajo una Licencia Creative Commons Atribución-NoComercial 4.0 Internacional.
Basada en una obra en http://www.mundonano.unam.mx.
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